Arteris Articles

Semiconductor Engineering: Variables Complicate Safety-Critical Device Verification

Kurt Shuler, Vice President of Marketing at Arteris IP participates in this new "Experts at the Table" article in Semiconductor Engineering:

Variables Complicate Safety-Critical Device Verification 

July 1st, 2020 - By Ann Steffora Mutschler

semiengineering-logo-2020What's the best way to approach designs like AI chips for automotive that can stand the test of time? 

 
SE: Where does the industry stand with the task of verifying safety-critical devices today?
 
Kurt Shuler responds, "At the chip level we still have a situation where the verification people and methodologies are separate from the functional safety people and methodologies. This results in some overlap and rework. As tools and data interchange standards (like IEEE P2851 being led by both IEEE and Accellera) mature, we’ll be able to have more automation where functional safety validation through fault injection can be executed as part of regular verification processes. This will help everyone in the industry have more confidence that products don’t regress in diagnostic coverage as new versions are developed and will provide integrators/users of safety-critical systems to more easily perform fault injection validation of safety mechanisms if they desire."
 

To read the entire SemiEngineering article, please click here: https://semiengineering.com/variables-complicate-safety-critical-device-verification/

Topics: SoC ISO 26262 automotive NoC technology semiconductor engineering ASIL D AI chips noc interconnect IP market IEEE P2851 fault injection